ŞAHIN, C.; ÖZDEN, M. Framework for Localization of Forgery Regions in Image. International Conference on Applied Engineering and Natural Sciences, [S. l.], v. 1, n. 1, p. 1071–1078, 2023. DOI: 10.59287/icaens.1131. Disponível em: https://as-proceeding.com/index.php/icaens/article/view/1131. Acesso em: 25 nov. 2024.